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Universal Kriging for Loran ASF Map Generation

Authors
Son, Pyo-WoongRhee, Joon HyoHwang, JaehuiSeo, Jiwon
Issue Date
8월-2019
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
IEEE Transactions on Aerospace and Electronic Systems, v.55, no.4, pp 1828 - 1842
Pages
15
Journal Title
IEEE Transactions on Aerospace and Electronic Systems
Volume
55
Number
4
Start Page
1828
End Page
1842
URI
https://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/1928
DOI
10.1109/taes.2018.2876587
ISSN
0018-9251
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