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Universal Kriging for Loran ASF Map Generation

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dc.contributor.authorSon, Pyo-Woong-
dc.contributor.authorRhee, Joon Hyo-
dc.contributor.authorHwang, Jaehui-
dc.contributor.authorSeo, Jiwon-
dc.date.accessioned2021-12-08T07:40:04Z-
dc.date.available2021-12-08T07:40:04Z-
dc.date.issued2019-08-
dc.identifier.issn0018-9251-
dc.identifier.urihttps://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/1928-
dc.format.extent15-
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)-
dc.titleUniversal Kriging for Loran ASF Map Generation-
dc.typeArticle-
dc.identifier.doi10.1109/taes.2018.2876587-
dc.identifier.bibliographicCitationIEEE Transactions on Aerospace and Electronic Systems, v.55, no.4, pp 1828 - 1842-
dc.citation.titleIEEE Transactions on Aerospace and Electronic Systems-
dc.citation.volume55-
dc.citation.number4-
dc.citation.startPage1828-
dc.citation.endPage1842-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
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