Development of Depth-sensitive X-ray Backscatter Imaging Method for Precise Cargo Containers Inspection

ChangHwi Lim; Park, Jong Won; Lee, Jeong Hee; Choi, Young chol

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Development of Depth-sensitive X-ray Backscatter Imaging Method for Precise Cargo Containers Inspection

Authors: ChangHwi Lim; Park, Jong Won; Lee, Jeong Hee; Choi, Young chol

Issue Date: 20231108

URI: https://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/10199

Place: 캐나다
벤쿠버 컨벤션센터

metadata.conference.dc.citation.conferenceName: 2023 IEEE NSS/MIC and TSD Conference

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Appears in Collections: ETC > 2. Conference Papers

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