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Development of Depth-sensitive X-ray Backscatter Imaging Method for Precise Cargo Containers Inspection
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | ChangHwi Lim | - |
| dc.contributor.author | Park, Jong Won | - |
| dc.contributor.author | Lee, Jeong Hee | - |
| dc.contributor.author | Choi, Young chol | - |
| dc.date.accessioned | 2024-01-10T12:31:46Z | - |
| dc.date.available | 2024-01-10T12:31:46Z | - |
| dc.date.issued | 20231108 | - |
| dc.identifier.uri | https://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/10199 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.title | Development of Depth-sensitive X-ray Backscatter Imaging Method for Precise Cargo Containers Inspection | - |
| dc.type | Conference | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 1 | - |
| dc.citation.conferenceName | 2023 IEEE NSS/MIC and TSD Conference | - |
| dc.citation.conferencePlace | 캐나다 | - |
| dc.citation.conferencePlace | 벤쿠버 컨벤션센터 | - |
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