IR signature management for the modern navy
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Vaitekunas, D.A. | - |
dc.contributor.author | Kim, Y. | - |
dc.date.accessioned | 2023-12-22T09:00:32Z | - |
dc.date.available | 2023-12-22T09:00:32Z | - |
dc.date.issued | 2013 | - |
dc.identifier.issn | 0277-786X | - |
dc.identifier.uri | https://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/8750 | - |
dc.description.abstract | A methodology for analysing the infrared (IR) signature and susceptibility of naval platforms using ShipIR/NTCS was presented by Vaitekunas (2010). This paper provides three key improvements: use of a larger climatic data set (N=100), a new target sub-image algorithm eliminating false detections from pixel-Aliasing at the horizon, and a new seeker model interfacing with a line-by-line background clutter model. Existing commercial stealth technologies (exhaust stack suppression, low solar absorptive paints, extended hull film-cooling) are re-Analysed using the new models and methods to produce a more rigorous and comprehensive analysis of their effectiveness based on the statistics of reduction in IR susceptibility. These methods and results combined with the cost of each stealth option should allow platform managers to select an appropriate level of infrared suppression and establish the design criteria for a new ship. ? 2013 SPIE. | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.title | IR signature management for the modern navy | - |
dc.type | Article | - |
dc.identifier.doi | 10.1117/12.2016499 | - |
dc.identifier.scopusid | 2-s2.0-84881033162 | - |
dc.identifier.bibliographicCitation | Proceedings of SPIE - The International Society for Optical Engineering, v.8706 | - |
dc.citation.title | Proceedings of SPIE - The International Society for Optical Engineering | - |
dc.citation.volume | 8706 | - |
dc.type.docType | Conference Paper | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | Background clutter | - |
dc.subject.keywordPlus | Comprehensive analysis | - |
dc.subject.keywordPlus | False detections | - |
dc.subject.keywordPlus | Infrared detection | - |
dc.subject.keywordPlus | Infrared signature | - |
dc.subject.keywordPlus | Naval platforms | - |
dc.subject.keywordPlus | Platform requirements | - |
dc.subject.keywordPlus | Suppression | - |
dc.subject.keywordPlus | Computer simulation | - |
dc.subject.keywordPlus | Imaging systems | - |
dc.subject.keywordPlus | Infrared imaging | - |
dc.subject.keywordPlus | Ship models | - |
dc.subject.keywordPlus | Design | - |
dc.subject.keywordAuthor | Infrared detection | - |
dc.subject.keywordAuthor | Infrared signature | - |
dc.subject.keywordAuthor | Infrared stealth | - |
dc.subject.keywordAuthor | Numerical simulation | - |
dc.subject.keywordAuthor | Platform requirements | - |
dc.subject.keywordAuthor | Ship model | - |
dc.subject.keywordAuthor | Suppression | - |
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