Reliable Fabrication Techniques of SiNW Based Nanosensors
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Bruce | - |
dc.contributor.author | Aleem, M. | - |
dc.contributor.author | Selvarathinam, T. | - |
dc.contributor.author | Kundu, S. | - |
dc.contributor.author | 이정희 | - |
dc.contributor.author | Park, J. | - |
dc.date.accessioned | 2025-02-24T02:00:04Z | - |
dc.date.available | 2025-02-24T02:00:04Z | - |
dc.date.issued | 2023-11 | - |
dc.identifier.issn | 0000-0000 | - |
dc.identifier.uri | https://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/10996 | - |
dc.description.abstract | This paper provides silicon nanowire based nanosensors with fabrication techniques that would reduce contamination due to intrinsic properties of silicon nanowires. We provide surface functionalization for explosive analytes such as TNT and RDX analytes. We provide FTIR characterizations of functionalized silicon nanowires to validate surface modification. ? 2023 IEEE. | - |
dc.format.extent | 5 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Reliable Fabrication Techniques of SiNW Based Nanosensors | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/NMDC57951.2023.10343546 | - |
dc.identifier.scopusid | 2-s2.0-85182023042 | - |
dc.identifier.bibliographicCitation | 2023 IEEE Nanotechnology Materials and Devices Conference, NMDC 2023, pp 595 - 599 | - |
dc.citation.title | 2023 IEEE Nanotechnology Materials and Devices Conference, NMDC 2023 | - |
dc.citation.startPage | 595 | - |
dc.citation.endPage | 599 | - |
dc.type.docType | Conference paper | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
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