Clean Collector Algorithm for Satellite Image Pre-Processing of SAR-to-EO Translation
DC Field | Value | Language |
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dc.contributor.author | Park, Se-Kil | - |
dc.contributor.author | Ju, Jin-Gi | - |
dc.contributor.author | Noh, Hyeon-Cheol | - |
dc.contributor.author | Choi, Dong-Geol | - |
dc.contributor.author | Kim, Min Woo | - |
dc.date.accessioned | 2025-01-08T05:00:29Z | - |
dc.date.available | 2025-01-08T05:00:29Z | - |
dc.date.issued | 2024-11 | - |
dc.identifier.issn | 2079-9292 | - |
dc.identifier.issn | 2079-9292 | - |
dc.identifier.uri | https://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/10573 | - |
dc.description.abstract | In applications such as environmental monitoring, algorithms and deep learning-based methods using synthetic aperture radar (SAR) and electro-optical (EO) data have been proposed with promising results. These results have been achieved using already cleaned datasets for training data. However, in real-world data collection, data are often collected regardless of environmental noises (clouds, night, missing data, etc.). Without cleaning the data with these noises, the trained model has a critical problem of poor performance. To address these issues, we propose the Clean Collector Algorithm (CCA). First, we use a pixel-based approach to clean the QA60 mask and outliers. Secondly, we remove missing data and night-time data that can act as noise in the training process. Finally, we use a feature-based refinement method to clean the cloud images using FID. We demonstrate its effectiveness by winning first place in the SAR-to-EO translation track of the MultiEarth 2023 challenge. We also highlight the performance and robustness of the CCA on other cloud datasets, SEN12MS-CR-TS and Scotland&India. | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | MDPI | - |
dc.title | Clean Collector Algorithm for Satellite Image Pre-Processing of SAR-to-EO Translation | - |
dc.type | Article | - |
dc.publisher.location | 스위스 | - |
dc.identifier.doi | 10.3390/electronics13224529 | - |
dc.identifier.scopusid | 2-s2.0-85210240972 | - |
dc.identifier.wosid | 001364811700001 | - |
dc.identifier.bibliographicCitation | ELECTRONICS, v.13, no.22 | - |
dc.citation.title | ELECTRONICS | - |
dc.citation.volume | 13 | - |
dc.citation.number | 22 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | Y | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Computer Science | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Computer Science, Information Systems | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordAuthor | real-world noise | - |
dc.subject.keywordAuthor | Fr & eacute | - |
dc.subject.keywordAuthor | chet inception distance | - |
dc.subject.keywordAuthor | SAR-to-EO image translation | - |
dc.subject.keywordAuthor | image pre-processing | - |
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