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Reliable Fabrication Techniques of SiNW Based Nanosensors
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Bruce Kim | - |
| dc.contributor.author | M. Aleem | - |
| dc.contributor.author | T. Selvarathinam | - |
| dc.contributor.author | S.Kundu | - |
| dc.contributor.author | Jeonghee Lee | - |
| dc.contributor.author | Jongwon Park | - |
| dc.date.accessioned | 2024-01-10T12:31:18Z | - |
| dc.date.available | 2024-01-10T12:31:18Z | - |
| dc.date.issued | 20231024 | - |
| dc.identifier.uri | https://www.kriso.re.kr/sciwatch/handle/2021.sw.kriso/10144 | - |
| dc.description.abstract | ―This paper provides silicon nanowire based nanosensors with fabrication techniques that would reduce contamination due to intrinsic properties of silicon nanowires. We provide surface functionalization for explosive analytes such as TNT and RDX analytes. We provide FTIR characterizations of functionalized silicon nanowires to validate surface modification. | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.title | Reliable Fabrication Techniques of SiNW Based Nanosensors | - |
| dc.type | Conference | - |
| dc.citation.startPage | 614 | - |
| dc.citation.endPage | 618 | - |
| dc.citation.conferenceName | 2023 IEEE Nanotechnology Materials and Devices Conference | - |
| dc.citation.conferencePlace | 이탈리아 | - |
| dc.citation.conferencePlace | Paestum(salemo) | - |
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