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Advanced container inspection system based on dual-angle X-ray imaging method

Lim, C. H.; Lee, Jeong Hee; Choi, Y.; Park, J. W.; Kim, H. K.

ArticleIssue Date2021CitationJOURNAL OF INSTRUMENTATION, v.16, no.8PublisherIOP PUBLISHING LTD
Monte Carlo analysis of megavoltage x-ray interaction-induced signal and noise in cadmium tungstate detectors for cargo container inspection

Kim, J.; Park, J.; Kim, J.; Kim, D. W.; Yun, S.; Lim, C. H.; Kim, H. K.

ArticleIssue Date2016CitationJOURNAL OF INSTRUMENTATION, v.11, no.11PublisherIOP PUBLISHING LTD
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